Semiconductor Process Instruments
The HRF-1 Production Interferometer is a vertical format
Fizeau Interferometer. It has a rapid test plate change
capability, a built in camera port with integral electronic
shutter, and easy adjustment to accommodate diffrent
thickness parts. It is designed for production optical shops
and allows readings in seconds on its built in display
screen. Its camera port has a standard "T" mount
for easy adaptation of film and CCD cameras. The HRF1 can be
supplied with a small base for direct mounting on standard
optical tables or with a larger base for free-standing
application.
Figure 1: HRF-1 Interferometer CONTACT US
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The Hudson Research UFT-1 Universal Foucalt
Tester is a precision instrument designed to perform all
classical optical bench tests. It incorporates a point
source arc lamp with adjustable slit as its source, and has
a precision knife edge in a rotary stage mount in itsviewing
system. The knife edge can be interchanged with a wire for
additional versatility. The precision rotary stage permits
highly accurate and repeatable measurement and determination
of the various zones of the optical element under test. This
instrument was originally developed for in-house testing of
the IR telescope used in our Hyperspectral Imaging
Spectroscope for the G-301 Space Shuttle Mission. It is
incorporated in our 3 Meter optical bench. The instrument
can be supplied with or without a bench and can be supplied
with any standard optical bench mounting required.
Figure 2: UFT-1 Universal Foucalt Tester
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Hudson Research is pleased to offer the HIS-2 Hyperspectral
Imaging Spectroscope as a commercial product. The HIS-2
represents the state-of-the-art in multispectral imaging
systems. It is the first commercially available system to
offer Sub-BLIPimaging with an uncooled temperature. The
ability to image objects that are colder than an uncooled
detector is unprecedented. The first Sub-BLIP images that
demonstrates this capability are presented at this web site
The instrument was originally designed for low earth orbit
application, but its commercial version can be customized to
suit the users needs. The general specifications (maximum
values) are given in table 1 below.
Spectral Bandwidths and
associated Window materials
Window Material KRS-5
Spectral Range: 0.5 microns - 25 microns
Window Material Diamond
Spectral Range: 0.1 microns - 80 microns
Window Material Enhanced Silicon
Spectral Range: 1.5 microns - 40 microns
Window Material Vacuum
Spectral Range: 30 GHz - 100 keV
General Secifications
Spectral Resolution: adjustable 32 - 150 nm
Number of Bands: 16 Filter Wheel Only; Continuous with Fabry-Perot; 4096 Maximum
Spectral Sensitivity: Shot-Noise Limited
Dynamic Range: >50,000:1
System Gain: >1024; digitally programable
Video Resolution: 4096 x 4096
Video Acquisition: Various Scan Sequences includiong Burst mode and continuous Mode
This diagram shows the general architecture
of the HIS instrument.
Figure 3 HIS-2 Hyperspectral Imaging
Spectroscope
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In response to demands from
the imaging industry, we have recently introduced the HRSP-1
Scanning Photometer. This instrument is designed to perfom
accurate linewidth measurements on CRT in the production
environment. It has numerous additional measurement and
quality control applications. It features both Analog and
Digital readouts for rapid alignment and accurate
measurements. It also has outputs for plotters and an RS-232
output is optional. The unit is supplied with NIST traceable
calibration any one standard calibration scale. Foot-Lambert
calibration is standard.
Control Head
